Metrology
The term Metrology, was most often related to nanotechnology, nanomaterials and the nanoscale. Nano metrology is based on the measurement of geometrical features of size, shape and roughness at the nanoscale. Mainly used instruments of nano metrology are Scanning Probe Microscope (SPM) and Atomic Force Microscope (AFM). Metrology is used in several expertise areas with the involvement of nanoparticles such as,
· Dimensional metrology
· Thin film metrology
· Metrology of structured materials
· Electrical metrology
Some of the examples of Nano metrological challenges include longer chains of metrological traceability, need to measure new characteristics unique to the nanoscale, Measurements in challenging environments (ultra-high vacuum or complex biological media).
Edelweiss Nanomaterial chemistry and technology journal is a scholarly journal that aims to publish most complete and reliable source of information on the findings and current developments in the form of original Research, Review, Opinion articles, Case reports, Mini review, Short communication. Edelweiss Nanomaterial chemistry and technology Journal publishes manuscripts on Metrology.
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