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Nano metrology is a sub-discipline of metrology and is concerned with the science of measurement at the Nano scale level including the quantitative determination of dimensions as well as other physical properties e.g. mechanical, electrical, magnetic, optical properties and combination thereof, chemical and biological properties of nanomaterial and events taking place at the Nano scale. The Nano metrology is helpful in Atomic Force Microscopy, X- Ray Diffraction, X-ray absorption Spectroscopy, Small Angle X-Ray Scattering, Scanning Tunneling Microscopy, Transmission Electron Microscopy, Capacitance Spectroscopy, and Polarization Spectroscopy.
Edelweiss Nanomaterial chemistry and technology journal is a scholarly journal that aims to publish most complete and reliable source of information on the findings and current developments in the form of original Research, Review, Opinion articles, Case reports, Mini review, Short communication. Edelweiss Nanomaterial chemistry and technology Journal publishes manuscripts on Nano metrology.
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Related article links for Nano metrology will appear here as matching content is published in Nanomaterial Chemistry and Technology (ISSN 2690-2575). Readers can also browse the journal archive and current issue for connected research.
